Recent Publications
Below is a list of some of the groups recent publications. A comprehensive listing can be found within this document.
News Update - 6/3/2012
NPL host the RINCE coffee morning, with the group members supplying home made food and cake for attendess to enjoy!
IEE Colloqium - Invited Talk
NPL Director Prof. Patrick McNally delivers invited talk to IEE Colloqium - 'Addressing Semiconductor Roadmap Challenges: New X-Ray Diffraction Imaging Techniques for Imaging Wafer Warpage in Systems on Chip'
News Update - 24/10/2011
Sonex Metrology wins EI Industrial Technologies Commercialisation Awadr. Full DCU press release can be found here!