About Us
Measurement and Characterisation Capabilities
Optical Component and Sub-System Characterisation
- Lasers, modulators SOA and fibre amplifiers characterisation
- Static DC characterisation
- Dynamic characterisation at RF speeds up to 40 GHz
- Frequency and spectral response
- Alpha parameter measurements
- Pulse amplitude and phase characterisation
Tunable Laser Characterisation
- Wavelength drift/locker measurements
- Switching speed and burst mode transmission
Radio-Over-Fibre System Tests
- Transmitter and receiver testing
- Bit Error Rate measurements
Transmission Tests
- OTDM, WDM and hybrid WDM/OTDM systems up to
160 Gb/s per channel - DCF compensated 40 km spans
- BER measurements STM-16, 64, 128
Advanced Modulation Format Systems
- OFDM, 16QAM, PSK, DPSK, QPSK Transmission
- Complete coherent receiver module
- 1 x 50GSa/s Real Time Oscilloscope
- 1 x 40GSa/s Real Time Oscilloscope
- 1 x 10GSa/s Arbitrary Waveform Generator
Optical Signal Temporal Analysis
- Eye diagram with 1 ps resolution
- Jitter analysis down to 200 fs
Optical Signal Spectral Analysis
- Linewidth measurements
- Complex (amplitude and phase) optical spectrum
analysis with 20 MHz resolution
Wafer and Sub-Mount Characterisation Station
- Single ended optical input/output
- 2 x DC probes
- 1 x 40 GHz RF probe (1 mm G-S-G)
- Temperature controlled mount
RF Component Analysis
- RF spectrum analyser < 75 GHz
- RF signal generator < 67 GHz
- RF network analyser <50 GHz
Optical Pulse Characterisation and Compression
- Nonlinear and linear spectrographic amplitude and phase
measurements down to 500 fs pulses - Optimised linear and nonlinear compmression
Pump-Probe Measurements
- 2 ps resolution in the C-band